Oda and Assistant Professor Khanh presented their researches at IEEE SAS

03/14/2017

Oda and Assistant Professor Khanh presented their researches at IEEE Sensors Applications Symposium (SAS)

Title

Experimental Demonstration of Non-Destructive Detection of IGBT Fault Positions by Magnetic Sensor
Analysis of VLSI Power Supply Network based on Current Estimation through Magnetic Field Measurement