- 金 雄鉉, 池田 誠,
"背景光補償型画素回路の検討",
映像情報メディア学会,Jul.2017.
- Parit Kanjanavirojkul, Nguyen Ngoc Mai-Khanh, Tetsuya Iizuka, Toru Nakura, and Kunihiro Asada,
"Impulse Signal Generator based on Current-Mode Excitation and Transmission Line Resonator", in Proceedings of IEEE International NEWCAS Conference(RESMIQ Best Student Paper Award), Jun.2017.
- K. koga, M. Ikeda,
"高性能3次元LSI向け狭ピッチVIAの接合不良とその電気的補償の検討",
LSIとシステムのワークショップ2017（ポスターセッション）, May.2017.
- N. Terao, T. Nakura, M. Ishida, R. Ikeno, T. Kusaka, T. Iizuka and K. Asada,
"Extension of Power Supply Impedance Emulation on ATE for Multiple Power Domain", in Proceedings of 22nd IEEE European Test Symposium (ETS) 2017, May.2017.
- Kunihiro Asada, Toru Nakura, Tetsuya Iizuka, Makoto Ikeda,
"Time-Domain Approach for Analog Circuits in Deep Sub-Micron LSI",
IEICE Electronics Express, vol. 15, no. 6, pp. 1 - 21,Mar.2017.
- Stewart Smith, Yudai Takeshiro, Yuji Okamoto, Jonathan G. Terry, Anthony J. Walton, Rimon Ikeno, Kunihiro Asada, and Yoshio Mita,
"Test Structures for Nano-Gap Fabrication Process Development for Nano-Electromechanical Systems,"
30th International Conference on Microelectronics Test Structures (ICMTS 2017), 9.4,Mar.2017.
- Naoto Usami, Jun Kinoshita, Rimon Ikeno, Yuki Okamoto, Masaaki Tanno, Kunihiro Asada, and Yoshio Mita,
"An arrayed test structure for transistor damage assessment induced by circuit analysis and repairing processes with back-side-accessing Focused Ion Beam,"
30th International Conference on Microelectronics Test Structures (ICMTS 2017), 6.1,Mar.2017.
- Rimon Ikeno, Yoshio Mita, and Kunihiro Asada,
"Line-edge quality optimization of electron-beam resist for high-throughput character projection exposure utilizing atomic force microscope analysis,"
Proc. SPIE 10148, Design-Process-Technology Co-optimization for Manufacturability X, 10148-33, Mar.2017.
- Y. Oda, T. Iizuka, T. Nakura, K. Asada,
"Analysis of VLSI Power Supply Network based on Current Estimation through Magnetic Field Measurement,"
in Proceedings of Sensors Applications Symposium Mar.2017.
- 池田司，池田誠,
"汎用暗号プロセッサにおけるモンゴメリ乗算器の並列化 ,"
2017年電子情報通信学会総合大会, Mar.2017.
- 寺尾直樹，名倉徹，石田雅裕，池野理門，日下崇，飯塚哲也，浅田邦博,
"LSIテストに向けた電源インピーダンス模擬,"
2017年電子情報通信学会総合大会(電子情報通信学会学術奨励賞), A-1-3,Mar.2017.
- Md. Maruf Hossain, Toru Nakura, Tetsuya Iizuka, Kunihiro Asada,
"Optimal Design Method of Sub-Ranging ADC Based on Stochastic Comparator",
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol. E101-A, no. 2, pp. 410 - 424,Feb.2017.
- Toru Nakura, Tetsuya Iizuka, Kunihiro Asada,
"A PLL Compiler from Specification to GDSII",
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol. E100-A, no. 12, pp. 2741 - 2749,Feb.2017.
- Parit Kanjanavirojkul, Nguyen Ngoc Mai-Khanh, Tetsuya Iizuka, Toru Nakura, Kunihiro Asada,
"Design, Analysis and Implementation of Pulse Generator by CMOS Flipped on Glass for Low Power UWB-IR",
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol. E100-A, no. 1, pp. 200 - 209,Jan.2017.
- K.Xu, T. Iizuka, T.Nakura and K. Asada,
"High Spatial Resolution Detection Method for Point Light Source in Scintillator,"
in Proceedings of Electronic Imaging 2017 (EI2017) Jan.2017.
- Xiao Yang, Hongbo Zhu, Toru Nakura, Tetsuya Iizuka and Kunihiro Asada,
"A 15 x 15 SPAD Array Sensor with Breakdown-Pixel-Extraction Architecture for Efficient Data Readout,"
in Proceedings of IEEE Asia and South Pacific Design Automation Conference (ASP-DAC) Jan.2017.
- 池田司，池田誠,
"楕円曲線に基づく公開鍵暗号向け汎用暗号プロセッサの設計,"
暗号と情報セキュリティシンポジウム(SCIS) 2017 Jan.2017.
- Masahiro Kano, Toru Nakura, Tetsuya Iizuka and Kunihiro Asada,
"Fine-Resolution Light Source Position Estimation Method for Scintillation Detector,"
in Proceedings of IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Dec.2016.
- 池田司，池田誠,
"1024bit までの有限体上の演算と256bit までの楕円曲線上の演算のための汎用暗号プロセッサ,"
電子情報通信学会ハードウェアセキュリティフォーラム2016 Dec.2016.
- Nguyen Ngoc Mai Khanh, Rimon Ikeno, Takahiro J. Yamaguchi, Tetsuya Iizuka, and Kunihiro Asada,
"Experimental Demonstration of Stochastic Comparators for Fine Resolution ADC Without Calibration,"
2016 IEEE International Conference on Electronics, Circuits, & Systems (ICECS), Dec.2016.